Physics of optoelectronic devices [...] XA-GB - download pdf or read online

By Shun Lien Chuang

ISBN-10: 0471109398

ISBN-13: 9780471109396

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This detection depth will obviously be a function of the material being studied but the range for almost all materials is in this three to ten atom layer depth region. The contributions of the various layers decrease exponentially so the signal is very strongly surface monolayer dependent. If one were to analyze the X-rays being emitted, one would have contributions from a considerable depth since the mean free path of the X-rays is much greater than the penetration depth of the primary beam. Thus, Auger analysis has become a most popular technique for surface analysis since it is so surface dependent.

Specific particle bombardment aspects A. I N ISS In ISS, a surface is bombarded with a beam of noble gas ions and the energies of the ions scattered under a fixed scattering angle are analyzed. The masses of the collision partners determine the energy of the scattered ions in billiard ball fashion. Details of the performance of a commercially available instrument are described by Honig and Harrison [ 6 0 ] . 5—3 keV ions, 10 μ Α / c m ion current density and an ion beam diameter of the order of 1 mm at the target.

70—73 42 the experiment can be performed with large extended surfaces and with a large range of heating rates. However, the term flash filament is still used to describe the basic technique in which thermal input produces desorbed neu­ tral particles as output. The flash filament method is not only used as a starting technique, but also as a secondary technique combined with other methods, since it can be added readily to most other surface analysis sys­ tems. Thus, in recent years, many experimenters using other surface analysis methods include flash filament capability in their systems.

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Physics of optoelectronic devices [...] XA-GB by Shun Lien Chuang

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